Time Domain Reflectometry
TDR is capable of detecting changes to conductive materials in packaged ICs, printed circuit boards (PCBs), and other devices. TDR analysis is used to detect continuity failures within conductors by sending a pulsed signal into a conductor and monitoring the reflection of that pulse. This non-destructive technique can be used to determine the location of continuity failures within conductor materials.
Time Domain Reflectometry Gallery
