Electrical Characterization

From curve trace analysis to transistor characterization and custom bench testing of a variety of electronic devices, Priority Labs has the equipment and experience to troubleshoot and test your devices. Our analysts and engineers have extensive bench testing and characterization experience with analog, digital and mixed signal devices.

Priority Labs specializes in failure analysis. Because of this, Priority Labs has a range of services and expertise that are dedicated to fault isolation. Priority Labs provides in-depth nodal analysis of circuits by utilization the focused ion beam (FIB) for performing probe pad deposition to access internal nodes and microprobing using our extensive selection of probe stations (with cold temperature capability and integrated dark boxes). Priority Labs is capable of probing small device geometries using 500 nm probe tips.

Electrical Characterization Gallery